Comparison of atomic force microscopy and zeta potential derived surface charge density

Research output: Contribution to journalLetterResearchpeer-review

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Comparison of atomic force microscopy and zeta potential derived surface charge density. / Herzberg, M.; Dobberschütz, S.; Okhrimenko, D.; Bovet, N. E.; Andersson, M. P.; Stipp, S. L. S.; Hassenkam, T.

In: EPL, Vol. 130, No. 3, 36001, 01.06.2020.

Research output: Contribution to journalLetterResearchpeer-review

Harvard

Herzberg, M, Dobberschütz, S, Okhrimenko, D, Bovet, NE, Andersson, MP, Stipp, SLS & Hassenkam, T 2020, 'Comparison of atomic force microscopy and zeta potential derived surface charge density', EPL, vol. 130, no. 3, 36001. https://doi.org/10.1209/0295-5075/130/36001

APA

Herzberg, M., Dobberschütz, S., Okhrimenko, D., Bovet, N. E., Andersson, M. P., Stipp, S. L. S., & Hassenkam, T. (2020). Comparison of atomic force microscopy and zeta potential derived surface charge density. EPL, 130(3), [36001]. https://doi.org/10.1209/0295-5075/130/36001

Vancouver

Herzberg M, Dobberschütz S, Okhrimenko D, Bovet NE, Andersson MP, Stipp SLS et al. Comparison of atomic force microscopy and zeta potential derived surface charge density. EPL. 2020 Jun 1;130(3). 36001. https://doi.org/10.1209/0295-5075/130/36001

Author

Herzberg, M. ; Dobberschütz, S. ; Okhrimenko, D. ; Bovet, N. E. ; Andersson, M. P. ; Stipp, S. L. S. ; Hassenkam, T. / Comparison of atomic force microscopy and zeta potential derived surface charge density. In: EPL. 2020 ; Vol. 130, No. 3.

Bibtex

@article{0321d8c3930840dd8bad2d63b5f8036b,
title = "Comparison of atomic force microscopy and zeta potential derived surface charge density",
abstract = "Surface charge density can be derived from atomic force microscopy (AFM) by using Derjaguin, Landau, Vervey and Overbeek (DLVO) theory. The sub-micrometer data allows observation of local differences in charge density and changes with time or solution composition, which has interesting applications in crystal growth and inhibition, bone formation and colloid behavior. To calibrate this type of AFM data and verify DLVO assumptions, it has to be correlated with an established technique. We successfully matched AFM derived surface charge densities with zeta potential measurements on a mica surface within one order of magnitude. A reproducible difference between surface charge of the mica substrate exposed to solutions cations with monovalent and divalent charge was also observed. The results provide confidence that the AFM method is valid for obtaining local surface charge information.",
author = "M. Herzberg and S. Dobbersch{\"u}tz and D. Okhrimenko and Bovet, {N. E.} and Andersson, {M. P.} and Stipp, {S. L. S.} and T. Hassenkam",
year = "2020",
month = "6",
day = "1",
doi = "10.1209/0295-5075/130/36001",
language = "English",
volume = "130",
journal = "EPL",
issn = "0295-5075",
publisher = "IOP Publishing",
number = "3",

}

RIS

TY - JOUR

T1 - Comparison of atomic force microscopy and zeta potential derived surface charge density

AU - Herzberg, M.

AU - Dobberschütz, S.

AU - Okhrimenko, D.

AU - Bovet, N. E.

AU - Andersson, M. P.

AU - Stipp, S. L. S.

AU - Hassenkam, T.

PY - 2020/6/1

Y1 - 2020/6/1

N2 - Surface charge density can be derived from atomic force microscopy (AFM) by using Derjaguin, Landau, Vervey and Overbeek (DLVO) theory. The sub-micrometer data allows observation of local differences in charge density and changes with time or solution composition, which has interesting applications in crystal growth and inhibition, bone formation and colloid behavior. To calibrate this type of AFM data and verify DLVO assumptions, it has to be correlated with an established technique. We successfully matched AFM derived surface charge densities with zeta potential measurements on a mica surface within one order of magnitude. A reproducible difference between surface charge of the mica substrate exposed to solutions cations with monovalent and divalent charge was also observed. The results provide confidence that the AFM method is valid for obtaining local surface charge information.

AB - Surface charge density can be derived from atomic force microscopy (AFM) by using Derjaguin, Landau, Vervey and Overbeek (DLVO) theory. The sub-micrometer data allows observation of local differences in charge density and changes with time or solution composition, which has interesting applications in crystal growth and inhibition, bone formation and colloid behavior. To calibrate this type of AFM data and verify DLVO assumptions, it has to be correlated with an established technique. We successfully matched AFM derived surface charge densities with zeta potential measurements on a mica surface within one order of magnitude. A reproducible difference between surface charge of the mica substrate exposed to solutions cations with monovalent and divalent charge was also observed. The results provide confidence that the AFM method is valid for obtaining local surface charge information.

U2 - 10.1209/0295-5075/130/36001

DO - 10.1209/0295-5075/130/36001

M3 - Letter

VL - 130

JO - EPL

JF - EPL

SN - 0295-5075

IS - 3

M1 - 36001

ER -

ID: 242654310